Production Platform
Lab Platform
Photoresisit Stripping
Compound Semiconductor
Failure Analysis
Deposition
Other
Process Highlights
About Us | Products | Applications | Service | News & Events | Contact | Careers | Home

Request For Quotation

 
*Name:
*Company:
*Phone:
*Email:
*Country:
Address Line 1:
Address Line 2:
City, State:
Zip / Postcode:
 
Budgetary Quote Formal Quote
Technical Detail Required
 
PROCESS
Etch Single Deposit Batch Strip
 
Substrate Process Loading
Manual Cassette Loadlock
 
SUBSTRATE
Die Dim: W: 50 x 50mm | Thickness 300 µ
2. Die Dim: W: x mm | Thickness µ
3. Die Dim: W: x mm | Thickness µ
4. Die Dim: W: x mm | Thickness µ
 
1. Full Wafer Round Square
Dim: mm Thickness µ
 
2. Full Wafer Round Square
Dim: mm Thickness µ
 
3. Full Wafer Round Square
Dim: mm Thickness µ
 
4. Full Wafer Round Square
Dim: mm Thickness µ
   
Substrate Base Material
1. 2.
3. 4.
5. 6.
7. 8.
9.  
 
Substrate Layer Material/Type To Be Etched/Deposited
1. Polyimide 2. PMMA
3. 4.
5. 6.
7. 8.
9.
 
Substrate Layer Material Thickness And Uniformity
1. µ/Å 2. µ/Å
3. µ/Å 4. µ/Å
5. µ/Å 6. µ/Å
7. µ/Å 8. µ/Å
9. µ/Å
 
Process Recipe Customer Supply With Tool
If Customer Provided Recipe, Please Provide Details:
 
Gasses Used
1. 2.
3. 4.
5. 6.
7. 8.
9.
 
Dopant Level
Thickness/Uniformity µ/Å
Topography
Mask Type And Thickness
Other Mask Type
Thickness
Minimum Line Width
% Surface Coverage By Photoresist Or Other Mask %
 
Desired Uniformity
Across Wafer +/– %
Wafer To Wafer +/– %
 
FACILITIES
Voltage Power Available
Volt Ampere # of phases Hz
 
Chill Water (PCW) (12°C > 18°C)
In-House With Tool
 
Compressed Air (CDA)
PSI/Bar CFM
 
Vacuum
Rough Vac Customer Supply With Tool
High Vac Customer Supply With Tool
Turbo Molecular Pump Customer Supply With Tool
Dry Pump Customer Supply With Tool
 
"*" Indicates a required field.